Efficient Trace Signal Selection for Silicon Debug by Error Transmission Analysis
نویسندگان
چکیده
منابع مشابه
Feature-based Signal Selection for Post-silicon Debug using Machine Learning
A key challenge of post-silicon validation methodology is to select a limited number of trace signals that are effective during post-silicon debug. Structural analysis used by traditional signal selection techniques are fast but lead to poor restoration quality. In contrast, simulation-based selection techniques provide superior restorability but incur significant computation overhead. While ea...
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A key challenge of post-silicon validation methodology is to select a limited number of trace signals that are effective during post-silicon debug. Structural analysis used by traditional signal selection techniques are fast but lead to poor restoration quality. In contrast, simulation-based selection techniques provide superior restorability but incur significant computation overhead. While ea...
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SIDEBAR: The future of DFD methodologies For reasons of cost, performance, power, and miniaturization, many electronic systems that once consisted of several printed circuit boards are now manufactured as a single semiconductor device. As a result of this complexity, previously accessible system signals can no longer be observed, and the process of isolating and analyzing silicon problems has b...
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Post-silicon validation is the time-consuming process of detecting and diagnosing defects in prototype silicon. It targets electrical and functional defects that escaped detection during pre-silicon verification. While the at-speed execution of test scenarios facilitates a higher test coverage than pre-silicon simulation, this comes at the cost of limited observability of signals in the integra...
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ژورنال
عنوان ژورنال: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
سال: 2012
ISSN: 0278-0070,1937-4151
DOI: 10.1109/tcad.2011.2171184